Laser beam scanning using near-field scanning optical microscopy nanoscale silicon-based photodetector
نویسندگان
چکیده
منابع مشابه
Nanoscale Optical Tomography using Volume-scanning Near-field Microscopy
microscopy Jin Sun, John C. Schotland, Rainer Hillenbrand, and P. Scott Carney Department of Electrical and Computer Engineering, University of Illinois, Urbana, Illinois 61801, USA Department of Bioengineering and Graduate Group in Applied Mathematics and Computational Science, University of Pennsylvania, Philadelphia, Pennsylvania 19104, USA Nanooptics Laboratory, CIC nanoGUNE Consolider, 200...
متن کاملScanning near-field optical microscopy.
An average human eye can see details down to 0,07 mm in size. The ability to see smaller details of the matter is correlated with the development of the science and the comprehension of the nature. Today's science needs eyes for the nano-world. Examples are easily found in biology and medical sciences. There is a great need to determine shape, size, chemical composition, molecular structure and...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملNear-field Scanning Optical Microscopy of Photonic Crystal Laser
Near-field scanning optical microscopy (NSOM) is a powerful alternative method to observe the optical intensity distributions in fabricated nanophotonic structures. Several groups have obtained NSOM images of photonic crystal (PC) [1-2]. Quite recently, we have reported the optical mode images obtained by NSOM on compact PC cavities based on fractional edge dislocations [3]. Here we report high...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
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ژورنال
عنوان ژورنال: Journal of Nanophotonics
سال: 2018
ISSN: 1934-2608
DOI: 10.1117/1.jnp.12.036002